Using a 1 MHz length-extension type of quartz resonator as a force sensor for frequency-modulation atomic force microscopy (AFM), atomically resolved images of the Si (111) - (7×7) surface was obtained. Fabrications of a tip attached at the front end of the resonator by focused ion beam, and removal of the native oxide layer on the tip by in-situ field ion microscopy are found effective for achieving the highly-resolved AFM imaging.
|Number of pages||3|
|Journal||Applied Physics Letters|
|Publication status||Published - 2005 Sept 26|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)