Atomic structure of "multilayer silicene" grown on Ag(111): Dynamical low energy electron diffraction analysis

Kazuaki Kawahara, Tetsuroh Shirasawa, Chun Liang Lin, Ryo Nagao, Noriyuki Tsukahara, Toshio Takahashi, Ryuichi Arafune, Maki Kawai, Noriaki Takagi

    Research output: Contribution to journalArticlepeer-review

    19 Citations (Scopus)

    Abstract

    We have investigated the atomic structure of the "multilayer silicene" grown on the Ag(111) single crystal surface by using low energy electron diffraction (LEED) and scanning tunneling microscopy (STM). We measured the intensity of the LEED spot as a function of the incident electron energy (I-V curve) and analyzed the I-V curve using a dynamical LEED theory. We have found that the Si(111)(√3×√3)-Ag model well reproduces the I-V curve whereas the models consisting of the honeycomb structure of Si do not. The bias dependence of the STM image of multilayer silicene agrees with that of the Si(111)(√3×√3)-Ag reconstructed surface. Consequently, we have concluded that the multilayer silicene grown on Ag(111) is identical to the Si(111)(√3×√3)-Ag reconstructed structure.

    Original languageEnglish
    Pages (from-to)70-75
    Number of pages6
    JournalSurface Science
    Volume651
    DOIs
    Publication statusPublished - 2016 Sep

    Keywords

    • Ag(111)
    • Low-energy electron diffraction
    • Silicene
    • Surface structure analysis

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Materials Chemistry

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