Atomic structure of a defect colony in silicon introduced during neutron irradiation in the JOYO reactor

Yutaka Ohno, Mitsuji Hirata, Seiji Takeda, Ryoji Fujimoto, Ryuichiro Oshima

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The structure of extended defects in a silicon crystal introduced during fission-neutron irradiation at 700 K in the JOYO fast breeder-type reactor have been examined by transmission electron diffraction using imaging plates and high-resolution electron microscopy. Defects of different nature i e {113} self-interstitial, and vacancy Frank and stacking fault tetrahedra defects, were observed in the defect colony. This observation revealed a novel distribution of extended defects; that defects of different nature coexist in a microscopic area rather than being mutually annihilated.

Original languageEnglish
Pages (from-to)380-387
Number of pages8
JournalJournal of Electron Microscopy
Volume45
Issue number5
DOIs
Publication statusPublished - 1996

Keywords

  • High-resolution electron microscopy
  • Imaging plate
  • Neutron irradiation
  • Silicon
  • Vacancy

ASJC Scopus subject areas

  • Instrumentation

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