Atomic structure of [0001]-tilt grain boundaries in ZnO: A high-resolution TEM study of fiber-textured thin films

Fumiyasu Oba, Hiromichi Ohta, Yukio Sato, Hideo Hosono, Takahisa Yamamoto, Yuichi Ikuhara

    Research output: Contribution to journalArticlepeer-review

    33 Citations (Scopus)


    The atomic structure of [0001]-tilt grain boundaries in ZnO was investigated using high-resolution transmission electron microscopy (HRTEM) and atomistic calculations. HRTEM observation was conducted for [0001] fiber-textured ZnO thin films grown on quartz-glass substrates by the pulsed-laser deposition. The [0001]-tilt boundaries observed in the films can be classified into three types: low-angle boundaries composed of irregular dislocation arrays, boundaries with {1010} facet structures, and near-low ∑ boundaries represented by symmetric periodicity units. The atomic structure of the boundaries is discussed with a focus on a ∑=7 boundary in conjunction with atomistic calculations and HRTEM image simulations. The ∑=7 boundary consists of multiple structural units that are very similar to the core structures of edge dislocations. Straight or zigzag arrangements of the dislocationlike structural units constitute other high-angle boundaries with symmetric and {1010} facet structures as well. It is suggested that [0001]-tilt boundaries in ZnO are generally described as an array of the dislocationlike units.

    Original languageEnglish
    Article number125415
    Pages (from-to)125415-1-125415-12
    JournalPhysical Review B - Condensed Matter and Materials Physics
    Issue number12
    Publication statusPublished - 2004 Sep

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

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