Atomic-Structure Characterization of Passive Film of Fe by Grazing Incidence X-ray Scattering at SPring-8

Masugu Sato, Masao Kimura, Masato Yamashita, Hiroyuki Konishi, Shinji Fujimoto, Yasunori Tabira, Takashi Doi, Masayasu Nagoshi, Shigeru Suzuki, Takayuki Kamimura, Takenori Nakayama, Toshiaki Ohtsuka

Research output: Chapter in Book/Report/Conference proceedingChapter

7 Citations (Scopus)

Abstract

This chapter presents a study, which investigates the atomic structure of the passive films on the porycrystalline substrates of pure iron by grazing incidence X-ray scattering and using synchrotron radiation at SPring-8. The X-ray scattering data clearly showed the dependence of the environment on the crystalicity of the passive film. The atomic radial distribution function derived from the data of the passive film, which was formed by anodic polarization in a borate buffer solution, indicated that its atomic structure had the characteristics of a spinel-type iron oxide. However, the ratios of the peak intensities of the dRDFs were quite different from each other. If these differences are intrinsic, it possibly suggests the difference in the occupancies of the Fe-sites originated in the differences in the sample conditions. However, the validity of this suggestion could not be examined as the S/N ratio of the X-ray scattering data was not sufficient enough to quantitatively discuss the amplitude of the dRDF.

Original languageEnglish
Title of host publicationPassivation of Metals and Semiconductors, and Properties of Thin Oxide Layers
PublisherElsevier
Pages95-100
Number of pages6
ISBN (Print)9780444522245
DOIs
Publication statusPublished - 2006

ASJC Scopus subject areas

  • Chemical Engineering(all)

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