Atomic structure and spin polarization at the apex of tips used in spin-polarized scanning tunneling microscopy

Shigekazu Nagai, Koichi Hata, Hirofumi Oka, Dirk Sander, Jürgen Kirschner

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

To analyze spin-polarized scanning tunneling microscopy (STM) studies quantitatively, we evaluated the atomic structure and spin polarization at the apex of Cr/Wand Fe/W tips using field ion microscopy (FIM) and field-emitted electron polarimetry, respectively. The patchwork-patterned H2- FIM images of the Cr/W tip indicated partially developed Cr planes, and the spin polarization at the surface was 10 ± 3% at room temperature. H 2-FIM images of the Fe/W tip indicate the crystalline order of Fe layers on the W (110) tip, and its spin polarization was 41 ± 2%. These first results allow us to quantify the spin polarization in spin-dependent STM measurements.

Original languageEnglish
Article number025204
JournalApplied Physics Express
Volume7
Issue number2
DOIs
Publication statusPublished - 2014 Feb
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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