TY - JOUR
T1 - Atomic scale imaging of TiO2(100) reconstructed surfaces by noncontact scanning nonlinear dielectric microscopy
AU - Sawai, Nobuhiro
AU - Yamasue, Kohei
AU - Cho, Yasuo
PY - 2012/12
Y1 - 2012/12
N2 - We performed noncontact scanning nonlinear dielectric microscopy (NC-SNDM) measurements to investigate both the topography and polarization distribution images of a reconstructed TiO2(100) surface. To acquire an atomic resolution image of the (110) surface, which is the most stable in TiO 2, NC-SNDM requires annealing at a temperature higher than that for scanning tunneling microscopy (STM). However, in the case of the (100) surface, we found that annealing at the same temperature as that used for STM was sufficient. The two types of reconstructed surfaces were measured using NC-SNDM. We confirmed we could even achieve NC-SNDM measurements in a dielectric material by reducing the thickness of the specimen and making the specimen nonstoichiometric without any annealing. These results show that NC-SNDM has superb capabilities that STM does not have, including the capability to measure the topography and polarization distribution even in a dielectric material, by inducing polarization near the surface without any means of inducing conductivity.
AB - We performed noncontact scanning nonlinear dielectric microscopy (NC-SNDM) measurements to investigate both the topography and polarization distribution images of a reconstructed TiO2(100) surface. To acquire an atomic resolution image of the (110) surface, which is the most stable in TiO 2, NC-SNDM requires annealing at a temperature higher than that for scanning tunneling microscopy (STM). However, in the case of the (100) surface, we found that annealing at the same temperature as that used for STM was sufficient. The two types of reconstructed surfaces were measured using NC-SNDM. We confirmed we could even achieve NC-SNDM measurements in a dielectric material by reducing the thickness of the specimen and making the specimen nonstoichiometric without any annealing. These results show that NC-SNDM has superb capabilities that STM does not have, including the capability to measure the topography and polarization distribution even in a dielectric material, by inducing polarization near the surface without any means of inducing conductivity.
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U2 - 10.1143/JJAP.51.121801
DO - 10.1143/JJAP.51.121801
M3 - Article
AN - SCOPUS:84872562361
VL - 51
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 12
M1 - 121801
ER -