TY - GEN
T1 - Atomic-scale-deformation-dynamics (ASDS) of nanowires and nanofilms
AU - Zhang, Ze
AU - Zhang, Yuefei
AU - Zheng, Kun
AU - Yue, Yonghai
AU - Wang, Lihua
AU - Liu, Pan
AU - Han, Xiaodong
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2010
Y1 - 2010
N2 - Nanowires and nanofilms are fundamental building blocks of micro and nano-electronics for both of bottom-up and top-down technologies. Monitoring and recording the mechanical property dynamics at atomic scale are important to understand the atomic mechanism of new and surprising nano-phenomena and design new applications. Through years' endeavors, we developed tensile and/or bending in-situ atomic-lattice resolution electron microscopy methods and equipments for nanowires and successfully conducted atomic-lattice resolution mechanical tests on individual nano-objects. With this, we observed the brittle materials SiC and Si nanowires (NWs) become highly ductile at room temperature. The crystalline structural evolution processes corresponding to the occurrence of unusual large strain plasticity includes the dislocation initiation, dislocation accumulation and amorphorization as well as the necking of the one dimensional nanowires were fully recorded at atomic scale and in real time. We also expand the experimental methods and equipments to two-dimensional nanofilms. An example of tensile experiment on nano-crystalline Au films is presented. The deformation mechanisms of nano-crystalline gold films were observed at the atomic scale and real-time. At the mean time, an atomic scale the crack blunting behavior was captured and the plastic deformation mechanism of the single nano-crystalline was revealed.
AB - Nanowires and nanofilms are fundamental building blocks of micro and nano-electronics for both of bottom-up and top-down technologies. Monitoring and recording the mechanical property dynamics at atomic scale are important to understand the atomic mechanism of new and surprising nano-phenomena and design new applications. Through years' endeavors, we developed tensile and/or bending in-situ atomic-lattice resolution electron microscopy methods and equipments for nanowires and successfully conducted atomic-lattice resolution mechanical tests on individual nano-objects. With this, we observed the brittle materials SiC and Si nanowires (NWs) become highly ductile at room temperature. The crystalline structural evolution processes corresponding to the occurrence of unusual large strain plasticity includes the dislocation initiation, dislocation accumulation and amorphorization as well as the necking of the one dimensional nanowires were fully recorded at atomic scale and in real time. We also expand the experimental methods and equipments to two-dimensional nanofilms. An example of tensile experiment on nano-crystalline Au films is presented. The deformation mechanisms of nano-crystalline gold films were observed at the atomic scale and real-time. At the mean time, an atomic scale the crack blunting behavior was captured and the plastic deformation mechanism of the single nano-crystalline was revealed.
KW - Atomic-scale
KW - Mechanical property
KW - Nanofilm
KW - Nanowire
KW - Transmission electron microscopy
UR - http://www.scopus.com/inward/record.url?scp=77955487704&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77955487704&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/MSF.654-656.1190
DO - 10.4028/www.scientific.net/MSF.654-656.1190
M3 - Conference contribution
AN - SCOPUS:77955487704
SN - 0878492550
SN - 9780878492558
T3 - Materials Science Forum
SP - 1190
EP - 1194
BT - PRICM7
PB - Trans Tech Publications Ltd
T2 - 7th Pacific Rim International Conference on Advanced Materials and Processing, PRICM-7
Y2 - 2 August 2010 through 6 August 2010
ER -