Atomic Resolution Studies on Surface Dipoles by Noncontact Scanning Nonlinear Dielectric Microscopy and Potentiometry

Kohei Yamasue, Yasuo Cho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Noncontact scanning nonlinear dielectric microscopy (NC-SNDM) is a microwave-based scanning probe microscopy method detecting the variation in the tip-sample capacitance. By detecting the second order nonlinear effect in dielectric polarization, this method enables imaging spontaneous polarization in materials. Although dielectric polarization is a material property formulated in a somewhat macroscopic sense, a series of the measurement results on cleaned semiconductor surfaces suggest that atomic-scale polarization, or atomic dipoles, can be resolved by NC-SNDM. Here we review unique capability of this method and mention its significance in solid state and surface physics. We also explain a novel extension of NC-SNDM, called noncontact scanning nonlinear dielectric potentiometry (NC-SNDP), and its application to the nanoscale evaluation of two-dimensional materials. The results reviewed here show that these methods will be tools for the atomic-scale investigation of surface and interface charge states even in a quantitative way.

Original languageEnglish
Title of host publicationIFCS-ISAF 2020 - Joint Conference of the IEEE International Frequency Control Symposium and IEEE International Symposium on Applications of Ferroelectrics, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728164304
DOIs
Publication statusPublished - 2020 Jul
Event2020 Joint Conference of the IEEE International Frequency Control Symposium and IEEE International Symposium on Applications of Ferroelectrics, IFCS-ISAF 2020 - Virtual, Keystone, United States
Duration: 2020 Jul 192020 Jul 23

Publication series

NameIFCS-ISAF 2020 - Joint Conference of the IEEE International Frequency Control Symposium and IEEE International Symposium on Applications of Ferroelectrics, Proceedings

Conference

Conference2020 Joint Conference of the IEEE International Frequency Control Symposium and IEEE International Symposium on Applications of Ferroelectrics, IFCS-ISAF 2020
CountryUnited States
CityVirtual, Keystone
Period20/7/1920/7/23

Keywords

  • scanning nonlinear dielectric microscopy
  • scanning nonlinear dielectric potentiometry
  • spontaneous polarization
  • surface dipoles
  • workfunction

ASJC Scopus subject areas

  • Signal Processing
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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