TY - GEN
T1 - Atomic Resolution Studies on Surface Dipoles by Noncontact Scanning Nonlinear Dielectric Microscopy and Potentiometry
AU - Yamasue, Kohei
AU - Cho, Yasuo
N1 - Funding Information:
This work is/was supported in part by Grant-in-Aid for Scientific Research (Grant Nos. 16H06360, 23226008, 24656027, 15K04673, and 20H02613) from the Japan Society for the Promotion of Science and by a Grant-in-Aid for Research and Development from Shimadzu Science Foundation.
Publisher Copyright:
© 2020 IEEE.
PY - 2020/7
Y1 - 2020/7
N2 - Noncontact scanning nonlinear dielectric microscopy (NC-SNDM) is a microwave-based scanning probe microscopy method detecting the variation in the tip-sample capacitance. By detecting the second order nonlinear effect in dielectric polarization, this method enables imaging spontaneous polarization in materials. Although dielectric polarization is a material property formulated in a somewhat macroscopic sense, a series of the measurement results on cleaned semiconductor surfaces suggest that atomic-scale polarization, or atomic dipoles, can be resolved by NC-SNDM. Here we review unique capability of this method and mention its significance in solid state and surface physics. We also explain a novel extension of NC-SNDM, called noncontact scanning nonlinear dielectric potentiometry (NC-SNDP), and its application to the nanoscale evaluation of two-dimensional materials. The results reviewed here show that these methods will be tools for the atomic-scale investigation of surface and interface charge states even in a quantitative way.
AB - Noncontact scanning nonlinear dielectric microscopy (NC-SNDM) is a microwave-based scanning probe microscopy method detecting the variation in the tip-sample capacitance. By detecting the second order nonlinear effect in dielectric polarization, this method enables imaging spontaneous polarization in materials. Although dielectric polarization is a material property formulated in a somewhat macroscopic sense, a series of the measurement results on cleaned semiconductor surfaces suggest that atomic-scale polarization, or atomic dipoles, can be resolved by NC-SNDM. Here we review unique capability of this method and mention its significance in solid state and surface physics. We also explain a novel extension of NC-SNDM, called noncontact scanning nonlinear dielectric potentiometry (NC-SNDP), and its application to the nanoscale evaluation of two-dimensional materials. The results reviewed here show that these methods will be tools for the atomic-scale investigation of surface and interface charge states even in a quantitative way.
KW - scanning nonlinear dielectric microscopy
KW - scanning nonlinear dielectric potentiometry
KW - spontaneous polarization
KW - surface dipoles
KW - workfunction
UR - http://www.scopus.com/inward/record.url?scp=85096985841&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85096985841&partnerID=8YFLogxK
U2 - 10.1109/IFCS-ISAF41089.2020.9234884
DO - 10.1109/IFCS-ISAF41089.2020.9234884
M3 - Conference contribution
AN - SCOPUS:85096985841
T3 - IFCS-ISAF 2020 - Joint Conference of the IEEE International Frequency Control Symposium and IEEE International Symposium on Applications of Ferroelectrics, Proceedings
BT - IFCS-ISAF 2020 - Joint Conference of the IEEE International Frequency Control Symposium and IEEE International Symposium on Applications of Ferroelectrics, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 Joint Conference of the IEEE International Frequency Control Symposium and IEEE International Symposium on Applications of Ferroelectrics, IFCS-ISAF 2020
Y2 - 19 July 2020 through 23 July 2020
ER -