Atomic-resolution investigation of irradiation-induced defects in silicon carbide

Chad M. Parish, Takaaki Koyanagi, Sosuke Kondo, Yutai Katoh

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)1042-1043
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
Publication statusPublished - 2014 Aug 1
Externally publishedYes
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: 2014 Aug 32014 Aug 7

ASJC Scopus subject areas

  • Instrumentation

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