Atomic resolution and in-situ characterization of structural ceramics

Yuichi Ikuhara

Research output: Contribution to journalArticlepeer-review

Abstract

Some of the improvements in transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), and in-situ STEM analysis for ceramic interface are discussed. Z-contrast images obtained by scanning transmission electron microscopy (STEM) is a very powerful technique to experimentally determine the location of the dopants segregated at grain boundaries. The technique is well suited for understanding the role of heavy impurities in grain boundaries composed of much lighter ions. In-situ TEM methods for observing the fracture behavior are effective in clarifying the microstructure of a crack wall, because the crack can be dynamically produced to form fresh surface in a TEM.

Original languageEnglish
Pages (from-to)43-44
Number of pages2
JournalKey Engineering Materials
Volume403
DOIs
Publication statusPublished - 2009
Externally publishedYes

Keywords

  • Al O
  • Fracture
  • GaN
  • Grain boundary
  • HREM
  • STEM
  • SiN

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint

Dive into the research topics of 'Atomic resolution and in-situ characterization of structural ceramics'. Together they form a unique fingerprint.

Cite this