Atomic resolution and in-situ characterization of structural ceramics

Yuichi Ikuhara

doi:10.4028/3-908454-00-X.43

Atomic resolution and in-situ characterization of structural ceramics

Yuichi Ikuhara

Research output: Contribution to journal › Article › peer-review

Abstract

Some of the improvements in transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), and in-situ STEM analysis for ceramic interface are discussed. Z-contrast images obtained by scanning transmission electron microscopy (STEM) is a very powerful technique to experimentally determine the location of the dopants segregated at grain boundaries. The technique is well suited for understanding the role of heavy impurities in grain boundaries composed of much lighter ions. In-situ TEM methods for observing the fracture behavior are effective in clarifying the microstructure of a crack wall, because the crack can be dynamically produced to form fresh surface in a TEM.

Original language	English
Pages (from-to)	43-44
Number of pages	2
Journal	Key Engineering Materials
Volume	403
DOIs	https://doi.org/10.4028/3-908454-00-X.43
Publication status	Published - 2009
Externally published	Yes

Keywords

Al O
Fracture
GaN
Grain boundary
HREM
STEM
SiN

ASJC Scopus subject areas

Materials Science(all)
Mechanics of Materials
Mechanical Engineering

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10.4028/3-908454-00-X.43

Cite this

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author = "Yuichi Ikuhara",

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AB - Some of the improvements in transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), and in-situ STEM analysis for ceramic interface are discussed. Z-contrast images obtained by scanning transmission electron microscopy (STEM) is a very powerful technique to experimentally determine the location of the dopants segregated at grain boundaries. The technique is well suited for understanding the role of heavy impurities in grain boundaries composed of much lighter ions. In-situ TEM methods for observing the fracture behavior are effective in clarifying the microstructure of a crack wall, because the crack can be dynamically produced to form fresh surface in a TEM.

KW - Al O

KW - Fracture

KW - GaN

KW - Grain boundary

KW - HREM

KW - STEM

KW - SiN

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Atomic resolution and in-situ characterization of structural ceramics

Abstract

Keywords

ASJC Scopus subject areas

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