Atomic resolution and in-situ characterization of structural ceramics

Yuichi Ikuhara

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Some of the improvements in transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), and in-situ STEM analysis for ceramic interface are discussed. Z-contrast images obtained by scanning transmission electron microscopy (STEM) is a very powerful technique to experimentally determine the location of the dopants segregated at grain boundaries. The technique is well suited for understanding the role of heavy impurities in grain boundaries composed of much lighter ions. In-situ TEM methods for observing the fracture behavior are effective in clarifying the microstructure of a crack wall, because the crack can be dynamically produced to form fresh surface in a TEM.

    Original languageEnglish
    Pages (from-to)43-44
    Number of pages2
    JournalKey Engineering Materials
    Volume403
    DOIs
    Publication statusPublished - 2009

    Keywords

    • Al O
    • Fracture
    • GaN
    • Grain boundary
    • HREM
    • STEM
    • SiN

    ASJC Scopus subject areas

    • Materials Science(all)
    • Mechanics of Materials
    • Mechanical Engineering

    Fingerprint Dive into the research topics of 'Atomic resolution and in-situ characterization of structural ceramics'. Together they form a unique fingerprint.

    Cite this