Atomic-level characterization of interfaces in LiCoO2

C. A.J. Fisher, S. Zheng, A. Kuwabara, H. Moriwake, Y. H. Ikuhara, H. Oki, Y. Ikuhara

Research output: Contribution to journalArticlepeer-review

Abstract

The powerful synergy between atomic-resolution electron microscopy and atomistic simulation techniques encompassing both first-principles and classical force-field calculations is illustrated through a study of grain boundaries, domain boundaries and surfaces of the lithium-ion secondary battery cathode material LiCoO2. Epitaxial thin films of LiCoO2 deposited on sapphire (0001) substrates are used as model samples, and results from simulation and experiment combined to characterize the structures and properties of representative interfaces.

Original languageEnglish
Pages (from-to)1-11
Number of pages11
JournalECS Transactions
Volume58
Issue number13
DOIs
Publication statusPublished - 2013
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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