Atomic layer epitaxy controlled by surface superstructures in SiC

Takashi Fuyuki, Tatsuo Yoshinobu, Hiroyuki Matsunami

Research output: Contribution to journalArticle

46 Citations (Scopus)

Abstract

Novel atomic layer epitaxy controlled by surface superstructures in SiC was demonstrated. An alternating supply of source gases of Si2H6 and C2H2 in gas source molecular beam epitaxy induced the transitions of the surface superstructures. When Si2H6 was supplied, Si atoms generated by thermal decomposition adsorbed on the substrate and constructed superstructures corresponding to the number of constituent Si atoms. When C2H2 was supplied, the adsorbed Si atoms reacted with the C2H2 molecules, resulting in crystallization. The growth rate seemed to be regulated by the limited number of Si atoms forming the superstructures. Single-crystalline 3C-SiC was homoepitaxially grown at a low substrate temperature of 1000 °C. Detailed analysis of dynamic reflected high energy electron diffraction observations revealed the proper configuration of the surface superstructures, and the possibility of single monolayer growth of 3C-SiC was presented.

Original languageEnglish
Pages (from-to)225-229
Number of pages5
JournalThin Solid Films
Volume225
Issue number1-2
DOIs
Publication statusPublished - 1993 Mar 25
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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