Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer

Tsuguhisa Sekioka, Kouichi Hayashi, Eiichiro Matsubara, Yukio Takahashi, Tetsutaro Hayashi, Mititaka Terasawa, Tohru Mitamura, Akihiro Iwase, Osamu Michikami

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Engineering & Materials Science

Physics & Astronomy