X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa2Cu3O7-δ (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.
- High-T superconductor
- Radiation damage
- Synchrotron radiation
- X-ray fluorescence holography
ASJC Scopus subject areas
- Nuclear and High Energy Physics