TY - JOUR
T1 - Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer
AU - Sekioka, Tsuguhisa
AU - Hayashi, Koichi
AU - Matsubara, Eiichiro
AU - Takahashi, Yukio
AU - Hayashi, Tetsutaro
AU - Terasawa, Mititaka
AU - Mitamura, Tohru
AU - Iwase, Akihiro
AU - Michikami, Osamu
PY - 2005/7/1
Y1 - 2005/7/1
N2 - X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa2Cu3O7-δ (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.
AB - X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa2Cu3O7-δ (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.
KW - High-T superconductor
KW - Radiation damage
KW - Synchrotron radiation
KW - X-ray fluorescence holography
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U2 - 10.1107/S0909049505006497
DO - 10.1107/S0909049505006497
M3 - Article
C2 - 15968134
AN - SCOPUS:23844489177
VL - 12
SP - 530
EP - 533
JO - Journal of Synchrotron Radiation
JF - Journal of Synchrotron Radiation
SN - 0909-0495
IS - 4
ER -