Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer

Tsuguhisa Sekioka, Kouichi Hayashi, Eiichiro Matsubara, Yukio Takahashi, Tetsutaro Hayashi, Mititaka Terasawa, Tohru Mitamura, Akihiro Iwase, Osamu Michikami

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa2Cu3O7-δ (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.

Original languageEnglish
Pages (from-to)530-533
Number of pages4
JournalJournal of Synchrotron Radiation
Volume12
Issue number4
DOIs
Publication statusPublished - 2005 Jul 1

Keywords

  • High-T superconductor
  • Radiation damage
  • Synchrotron radiation
  • X-ray fluorescence holography

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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