Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer

Tsuguhisa Sekioka; Kouichi Hayashi; Eiichiro Matsubara; Yukio Takahashi; Tetsutaro Hayashi; Mititaka Terasawa; Tohru Mitamura; Akihiro Iwase; Osamu Michikami

doi:10.1107/S0909049505006497

Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer

Tsuguhisa Sekioka, Kouichi Hayashi, Eiichiro Matsubara, Yukio Takahashi, Tetsutaro Hayashi, Mititaka Terasawa, Tohru Mitamura, Akihiro Iwase, Osamu Michikami

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa₂Cu₃O_7-δ (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.

Original language	English
Pages (from-to)	530-533
Number of pages	4
Journal	Journal of Synchrotron Radiation
Volume	12
Issue number	4
DOIs	https://doi.org/10.1107/S0909049505006497
Publication status	Published - 2005 Jul 1

Keywords

High-T superconductor
Radiation damage
Synchrotron radiation
X-ray fluorescence holography

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Instrumentation

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10.1107/S0909049505006497

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Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer. / Sekioka, Tsuguhisa; Hayashi, Kouichi; Matsubara, Eiichiro; Takahashi, Yukio; Hayashi, Tetsutaro; Terasawa, Mititaka; Mitamura, Tohru; Iwase, Akihiro; Michikami, Osamu.

In: Journal of Synchrotron Radiation, Vol. 12, No. 4, 01.07.2005, p. 530-533.

Research output: Contribution to journal › Article › peer-review

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AU - Takahashi, Yukio

AU - Hayashi, Tetsutaro

AU - Terasawa, Mititaka

AU - Mitamura, Tohru

AU - Iwase, Akihiro

AU - Michikami, Osamu

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Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer

Abstract

Keywords

ASJC Scopus subject areas

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