TY - JOUR
T1 - Atomic force microscopy observation of membrane proteins suspended over carbon nanotube network
AU - Sumitomo, Koji
AU - Shinozaki, Youichi
AU - Takagi, Daisuke
AU - Nakashima, Hiroshi
AU - Kobayashi, Yoshihiro
AU - Torimitsu, Keiichi
PY - 2009/8
Y1 - 2009/8
N2 - Atomic force microscopy (AFM) imaging of membrane proteins suspended over a nanostructure in liquid is a promising way to understand the structure and function of working proteins, although the membrane deformation that occurs during scanning makes it difficult to obtain a high resolution image. This study proposes an artificial cell system for the AFM observation of functional membrane proteins that consists of a sub-micron well on Si, a biological membrane, and a carbon nanotube (CNT) network. We successfully observed molecular-scale images of a purple membrane suspended over sub-micron well patterns. By using a CNT network to hold the suspended membrane, we suppressed the membrane deformation caused by the "imaging force". The CNT network takes the place of a cytoskeleton in supporting the cell membrane suspended over the well thus improving the spatial resolution of AFM measurement.
AB - Atomic force microscopy (AFM) imaging of membrane proteins suspended over a nanostructure in liquid is a promising way to understand the structure and function of working proteins, although the membrane deformation that occurs during scanning makes it difficult to obtain a high resolution image. This study proposes an artificial cell system for the AFM observation of functional membrane proteins that consists of a sub-micron well on Si, a biological membrane, and a carbon nanotube (CNT) network. We successfully observed molecular-scale images of a purple membrane suspended over sub-micron well patterns. By using a CNT network to hold the suspended membrane, we suppressed the membrane deformation caused by the "imaging force". The CNT network takes the place of a cytoskeleton in supporting the cell membrane suspended over the well thus improving the spatial resolution of AFM measurement.
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U2 - 10.1143/JJAP.48.08JB18
DO - 10.1143/JJAP.48.08JB18
M3 - Article
AN - SCOPUS:77952410216
VL - 48
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 8 PART 3
M1 - 08JB18
ER -