Atomic force microscopy investigation of mechanical property of natural rubber 4

Satoshi Nagayama; Naoto Ohno; Hiroyuki Watabe; Ken Nakajima; Toshio Nishi

Atomic force microscopy investigation of mechanical property of natural rubber 4

Satoshi Nagayama, Naoto Ohno, Hiroyuki Watabe, Ken Nakajima, Toshio Nishi

Research output: Contribution to conference › Paper › peer-review

Abstract

The changes of morphology and mechanical property of a vulcanized natural rubber subjected to large strains were studied by nanorheology mapping using atomic force microscopy. The natural rubbers were stretched uniaxially at different extension ratio from 3 to 5. We measured the change of elastic modulus at nano-scale and will show the relationship with the stress-strain curve at macro-scale.

Original language	English
Number of pages	1
Publication status	Published - 2006 Oct 18
Event	55th SPSJ Annual Meeting - Nagoya, Japan Duration: 2006 May 24 → 2006 May 26

Other

Other	55th SPSJ Annual Meeting
Country	Japan
City	Nagoya
Period	06/5/24 → 06/5/26

Keywords

Atomic Force Microscopy
Elastic Modulus
Morphology
Nanorheology
Natural Rubber

ASJC Scopus subject areas

Engineering(all)

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title = "Atomic force microscopy investigation of mechanical property of natural rubber 4",

abstract = "The changes of morphology and mechanical property of a vulcanized natural rubber subjected to large strains were studied by nanorheology mapping using atomic force microscopy. The natural rubbers were stretched uniaxially at different extension ratio from 3 to 5. We measured the change of elastic modulus at nano-scale and will show the relationship with the stress-strain curve at macro-scale.",

keywords = "Atomic Force Microscopy, Elastic Modulus, Morphology, Nanorheology, Natural Rubber",

author = "Satoshi Nagayama and Naoto Ohno and Hiroyuki Watabe and Ken Nakajima and Toshio Nishi",

year = "2006",

month = oct,

day = "18",

language = "English",

note = "55th SPSJ Annual Meeting ; Conference date: 24-05-2006 Through 26-05-2006",

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TY - CONF

T1 - Atomic force microscopy investigation of mechanical property of natural rubber 4

AU - Nagayama, Satoshi

AU - Ohno, Naoto

AU - Watabe, Hiroyuki

AU - Nakajima, Ken

AU - Nishi, Toshio

PY - 2006/10/18

Y1 - 2006/10/18

N2 - The changes of morphology and mechanical property of a vulcanized natural rubber subjected to large strains were studied by nanorheology mapping using atomic force microscopy. The natural rubbers were stretched uniaxially at different extension ratio from 3 to 5. We measured the change of elastic modulus at nano-scale and will show the relationship with the stress-strain curve at macro-scale.

AB - The changes of morphology and mechanical property of a vulcanized natural rubber subjected to large strains were studied by nanorheology mapping using atomic force microscopy. The natural rubbers were stretched uniaxially at different extension ratio from 3 to 5. We measured the change of elastic modulus at nano-scale and will show the relationship with the stress-strain curve at macro-scale.

KW - Atomic Force Microscopy

KW - Elastic Modulus

KW - Morphology

KW - Nanorheology

KW - Natural Rubber

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T2 - 55th SPSJ Annual Meeting

Y2 - 24 May 2006 through 26 May 2006

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