Atomic-force-microscopy images of graphite due to van der Waals interactions

Chuji Horie, Hiroshi Miyazaki

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

The theoretical investigation of atomic-force-microscopy (AFM) images of graphite, in the case where van der Waals interactions play a major role, is presented. It is shown that the images display a centered hexagon formed by the center of the atomic hexagon on the top layer when the AFM is operated at distances at which forces between the tip and the surface become attractive. At closer distances at which forces change from attractive to repulsive, all atomic sites on the top surface of graphite become visible. Effects of multiple atoms lying on the top of the tip are examined. It is shown that, if the atomic arrangement on the top of the tip does not meet with the threefold symmetry of the graphite surface, the AFM images are significantly deformed.

Original languageEnglish
Pages (from-to)11757-11761
Number of pages5
JournalPhysical Review B
Volume42
Issue number18
DOIs
Publication statusPublished - 1990 Jan 1

ASJC Scopus subject areas

  • Condensed Matter Physics

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