TY - JOUR
T1 - Atomic force microscope-assisted scanning tunneling spectroscopy under ambient conditions
AU - Vakhshouri, Amin
AU - Hashimoto, Katsushi
AU - Hirayama, Yoshiro
N1 - Publisher Copyright:
© The Author 2014. Published by Oxford University Press on behalf of The Japanese Society of Microscopy.
PY - 2014/12
Y1 - 2014/12
N2 - We have developed a method of atomic force microscopy (AFM)-assisted scanning tunnelling spectroscopy (STS) under ambient conditions. An AFM function is used for rapid access to a selected position prior to performing STS. The AFM feedback is further used to suppress vertical thermal drift of the tip–sample distance during spectroscopy, enabling flexible and stable spectroscopy measurements at room temperature.
AB - We have developed a method of atomic force microscopy (AFM)-assisted scanning tunnelling spectroscopy (STS) under ambient conditions. An AFM function is used for rapid access to a selected position prior to performing STS. The AFM feedback is further used to suppress vertical thermal drift of the tip–sample distance during spectroscopy, enabling flexible and stable spectroscopy measurements at room temperature.
KW - Combined atomic force/tunneling microscopy
KW - Room temperature tunneling spectroscopy
KW - Thermal drift suppression
UR - http://www.scopus.com/inward/record.url?scp=84948395747&partnerID=8YFLogxK
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U2 - 10.1093/jmicro/dfu028
DO - 10.1093/jmicro/dfu028
M3 - Article
AN - SCOPUS:84948395747
SN - 2050-5698
VL - 63
SP - 475
EP - 479
JO - Microscopy (Oxford, England)
JF - Microscopy (Oxford, England)
IS - 6
ER -