Atomic force microscope-assisted scanning tunneling spectroscopy under ambient conditions

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1 Citation (Scopus)

Abstract

We have developed a method of atomic force microscopy (AFM)-assisted scanning tunnelling spectroscopy (STS) under ambient conditions. An AFM function is used for rapid access to a selected position prior to performing STS. The AFM feedback is further used to suppress vertical thermal drift of the tip–sample distance during spectroscopy, enabling flexible and stable spectroscopy measurements at room temperature.

Original languageEnglish
Pages (from-to)475-479
Number of pages5
JournalMicroscopy
Volume63
Issue number6
DOIs
Publication statusPublished - 2014 Dec

Keywords

  • Combined atomic force/tunneling microscopy
  • Room temperature tunneling spectroscopy
  • Thermal drift suppression

ASJC Scopus subject areas

  • Structural Biology
  • Instrumentation
  • Radiology Nuclear Medicine and imaging

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