We have developed a method of atomic force microscopy (AFM)-assisted scanning tunnelling spectroscopy (STS) under ambient conditions. An AFM function is used for rapid access to a selected position prior to performing STS. The AFM feedback is further used to suppress vertical thermal drift of the tip–sample distance during spectroscopy, enabling flexible and stable spectroscopy measurements at room temperature.
- Combined atomic force/tunneling microscopy
- Room temperature tunneling spectroscopy
- Thermal drift suppression
ASJC Scopus subject areas
- Structural Biology
- Radiology Nuclear Medicine and imaging