Atomic and electronic structures of Cu/sapphire interfaces by HRTEM and EELS analyses

T. Sasaki; T. Mizoguchi; K. Matsunaga; S. Tanaka; T. Yamamoto; M. Kohyama; Y. Ikuhara

doi:10.4028/0-87849-960-1.3859

Atomic and electronic structures of Cu/sapphire interfaces by HRTEM and EELS analyses

T. Sasaki, T. Mizoguchi, K. Matsunaga, S. Tanaka, T. Yamamoto, M. Kohyama, Y. Ikuhara

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

Interfacial atomic and electronic structures of Cu/Al₂O ₃(0001) and Cu/Al₂O₃(1120) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al ₂O₃ systems.

Original language	English
Pages (from-to)	3859-3862
Number of pages	4
Journal	Materials Science Forum
Volume	475-479
Issue number	V
DOIs	https://doi.org/10.4028/0-87849-960-1.3859
Publication status	Published - 2005
Externally published	Yes
Event	PRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China Duration: 2004 Nov 2 → 2004 Nov 5

Keywords

Cu/sapphire interfaces
Electron energy-loss spectroscopy (EELS)
High-resolution transmission electron microscopy (HRTEM)

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.4028/0-87849-960-1.3859

Cite this

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title = "Atomic and electronic structures of Cu/sapphire interfaces by HRTEM and EELS analyses",

abstract = "Interfacial atomic and electronic structures of Cu/Al2O 3(0001) and Cu/Al2O3(1120) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al 2O3 systems.",

keywords = "Cu/sapphire interfaces, Electron energy-loss spectroscopy (EELS), High-resolution transmission electron microscopy (HRTEM)",

author = "T. Sasaki and T. Mizoguchi and K. Matsunaga and S. Tanaka and T. Yamamoto and M. Kohyama and Y. Ikuhara",

year = "2005",

doi = "10.4028/0-87849-960-1.3859",

language = "English",

volume = "475-479",

pages = "3859--3862",

journal = "Materials Science Forum",

issn = "0255-5476",

publisher = "Trans Tech Publications",

number = "V",

note = "PRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing ; Conference date: 02-11-2004 Through 05-11-2004",

}

TY - JOUR

T1 - Atomic and electronic structures of Cu/sapphire interfaces by HRTEM and EELS analyses

AU - Sasaki, T.

AU - Mizoguchi, T.

AU - Matsunaga, K.

AU - Tanaka, S.

AU - Yamamoto, T.

AU - Kohyama, M.

AU - Ikuhara, Y.

PY - 2005

Y1 - 2005

N2 - Interfacial atomic and electronic structures of Cu/Al2O 3(0001) and Cu/Al2O3(1120) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al 2O3 systems.

AB - Interfacial atomic and electronic structures of Cu/Al2O 3(0001) and Cu/Al2O3(1120) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al 2O3 systems.

KW - Cu/sapphire interfaces

KW - Electron energy-loss spectroscopy (EELS)

KW - High-resolution transmission electron microscopy (HRTEM)

UR - http://www.scopus.com/inward/record.url?scp=17144430146&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=17144430146&partnerID=8YFLogxK

U2 - 10.4028/0-87849-960-1.3859

DO - 10.4028/0-87849-960-1.3859

M3 - Conference article

AN - SCOPUS:17144430146

VL - 475-479

SP - 3859

EP - 3862

JO - Materials Science Forum

JF - Materials Science Forum

SN - 0255-5476

IS - V

T2 - PRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing

Y2 - 2 November 2004 through 5 November 2004

ER -

Atomic and electronic structures of Cu/sapphire interfaces by HRTEM and EELS analyses

Abstract

Keywords

ASJC Scopus subject areas

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