Atomic and electronic structures of Cu/sapphire interfaces by HRTEM and EELS analyses

T. Sasaki, T. Mizoguchi, K. Matsunaga, S. Tanaka, T. Yamamoto, M. Kohyama, Y. Ikuhara

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)

Abstract

Interfacial atomic and electronic structures of Cu/Al2O 3(0001) and Cu/Al2O3(1120) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al 2O3 systems.

Original languageEnglish
Pages (from-to)3859-3862
Number of pages4
JournalMaterials Science Forum
Volume475-479
Issue numberV
DOIs
Publication statusPublished - 2005 Jan 1
Externally publishedYes
EventPRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China
Duration: 2004 Nov 22004 Nov 5

Keywords

  • Cu/sapphire interfaces
  • Electron energy-loss spectroscopy (EELS)
  • High-resolution transmission electron microscopy (HRTEM)

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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