Atom-resolved STEM characterization for advanced materials

Yuichi Ikuhara

Research output: Contribution to journalArticlepeer-review

Abstract

Recently developed Cs corrected HAADF and ABF STEM are applied to visualize a single atom in a crystal and to directly observe the light elements in a crystal. These results are quantitatively analyzed and interpreted by combining first principles calculations. It is demonstrated that HAADF-STEM enables us to directly observe single dopant in a crystal and the dopant distribution in Ce doped cubic boron nitride (CBN). It is also shown that ABF-STEM is very powerful to directly observe the light elements such as lithium and hydrogen atomic columns in the respective crystals.

Original languageEnglish
Pages (from-to)628-629
Number of pages2
JournalKobunshi
Volume63
Issue number9
Publication statusPublished - 2014 Sep 1
Externally publishedYes

Keywords

  • ABF
  • Cs-corrector
  • Dopant
  • HAADF
  • Hydrogen
  • Light Element
  • Lithium
  • STEM

ASJC Scopus subject areas

  • Chemical Engineering(all)

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