Atom probe tomography of GB segregation in nanocrystalline Ni alloy

L. H. Qian, M. W. Chen, M. K. Miller, S. Kuwano, Y. Fujikawa, A. Inoue, Toshio Sakurai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationIVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium
Pages177
Number of pages1
DOIs
Publication statusPublished - 2006
Externally publishedYes
Event19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006 - Guilin, China
Duration: 2006 Jul 172006 Jul 20

Publication series

NameIVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium

Other

Other19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006
Country/TerritoryChina
CityGuilin
Period06/7/1706/7/20

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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