Atom probe tomography of GB segregation in nanocrystalline Ni alloy

L. H. Qian, Mingwei Chen, M. K. Miller, S. Kuwano, Y. Fujikawa, A. Inoue, T. Sakurai

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Original languageEnglish
    Title of host publicationIVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium
    Number of pages1
    DOIs
    Publication statusPublished - 2006 Dec 1
    Event19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006 - Guilin, China
    Duration: 2006 Jul 172006 Jul 20

    Publication series

    NameIVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium

    Other

    Other19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006
    CountryChina
    CityGuilin
    Period06/7/1706/7/20

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

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