Arrangement of probes for measuring case depth by means of four-point probes

Fumio Takeo, Kanako Nakajima, Takeru Baba, Yuki Aonahata, Masumi Saka

Research output: Contribution to journalConference articlepeer-review

10 Citations (Scopus)

Abstract

In the present paper, the suitable arrangement of probes to measure case depth of shaft-like materials by using four-point probes method was considered. In the induction hardening process, case depth is essential for its quality control. It needs great time and labor to measure hardness distribution in the sectional area with cutting the samples. In the previous paper, we have proposed a procedure to evaluate case depth of shaft-like materials by using four-point probes method. This study was aimed at enhancement of sensitivity of evaluation. The potential drop for various probe arrangements on the surface of shaft-like materials was analyzed by using finite element method. The surface hardened shaft was modeled as a two layered structure having different electrical resistivity in surface hardened layer and inner untreated part. The value of resistivity obtained from experiment using carbon steel was used for numerical calculation. The effect of probe arrangement in axial direction or circumferential direction, distance between current input-output probes, and distance between current input-output probes and potential measuring probes, on change in potential drop by case depth was shown. From the results, suitable probe arrangement for sensitive evaluation was considered.

Original languageEnglish
Pages (from-to)82-88
Number of pages7
JournalKey Engineering Materials
Volume270-273
Issue numberI
DOIs
Publication statusPublished - 2004
EventProceedings of the 11th Asian Pacific Conference on Nondestructive Testing - Jeju Island, Korea, Republic of
Duration: 2003 Nov 32003 Nov 7

Keywords

  • Case depth
  • FEM
  • Four-point probes method
  • Probe arrangement

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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