ARHVTEM of the Pd/ZnO heterointerface chemical structure

Kenji Murakami, Mitsuhiro Saito, Eriko Takuma, Hideki Ichinose

    Research output: Contribution to journalArticlepeer-review

    8 Citations (Scopus)

    Abstract

    Atomic-resolution high-voltage transmission electron microscopy was applied to the atomic structure analysis of a well-defined Pd/ZnO polar interface, which was produced by internal oxidation. Viewing the ZnO along 〈112̄0〉 axis, each atomic column consists of either oxygen or zinc, so that an individual column was directly identified from the image contrast of the picture taken at the Scherzer defocus condition. The terminating chemical element at the Pd/ZnO interface, which is parallel to {111}Pd and to {0001}ZnO, was shown to be zinc but not oxygen on both sides of the precipitate.

    Original languageEnglish
    Pages (from-to)27-32
    Number of pages6
    JournalJournal of Electron Microscopy
    Volume52
    Issue number1
    DOIs
    Publication statusPublished - 2003 May 13

    Keywords

    • HVTEM
    • Interface chemical structure
    • Internal oxidation
    • Projected potential image
    • ZnO/Pd interface

    ASJC Scopus subject areas

    • Instrumentation

    Fingerprint Dive into the research topics of 'ARHVTEM of the Pd/ZnO heterointerface chemical structure'. Together they form a unique fingerprint.

    Cite this