Approaching the theoretical elastic strain limit in copper nanowires

Yonghai Yue, Pan Liu, Ze Zhang, Xiaodong Han, En Ma

    Research output: Contribution to journalArticlepeer-review

    167 Citations (Scopus)

    Abstract

    Three sets of uniaxial tensile tests have been performed in situ in transmission electron microscopy/high-resolution electron microscopy on Cu nanowires (NWs) to accurately map out the sample size dependence of elastic strain limit. Atomic-resolution evidence was obtained for an exceedingly large recoverable strain (as much as 7.2%) that can be sustained in the lattice of a single-crystalline Cu NW with a diameter of ∼5.8 nm. This ultrahigh elastic strain is consistent with the predictions from molecular dynamics simulations for nanowires and approaches the ideal elastic limit predicted for Cu by ab initio calculations.

    Original languageEnglish
    Pages (from-to)3151-3155
    Number of pages5
    JournalNano Letters
    Volume11
    Issue number8
    DOIs
    Publication statusPublished - 2011 Aug 10

    Keywords

    • Theoretical elastic limit
    • copper nanowire
    • in situ TEM
    • size dependence

    ASJC Scopus subject areas

    • Bioengineering
    • Chemistry(all)
    • Materials Science(all)
    • Condensed Matter Physics
    • Mechanical Engineering

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