TY - GEN
T1 - Applications of magnetic thin film to integrated EM field shielding and in-line noise suppression
AU - Yamaguchi, Masahiro
AU - Kim, Ki Hycon
AU - Ikeda, Shinji
AU - Arai, Ken Ichi
AU - Shimada, Yutaka
AU - Matsushita, Nobuhiro
AU - Abe, Masanori
N1 - Publisher Copyright:
© 2003 IEEE.
PY - 2003
Y1 - 2003
N2 - RF integrated thin-film EM field shielding and inline noise suppression have been demonstrated by using Co85Nb12Zr3 amorphous film and electroplated Ni-Zn(-Co) ferrite films. The FMR loss generation at GHz frequency range is essential to realize this idea. The frequency range of loss generation can be adjusted to specific applications by materials selection and by the magnetic micro wiring technique. Insertion toss was only 0.7dB at 1GHz and reached 14 dB for a 17.2mm long coplanar transmission line with a 0.5-μm-thick Co85Nb12Zr3 film provided the in-between gap was 7.5 μm.
AB - RF integrated thin-film EM field shielding and inline noise suppression have been demonstrated by using Co85Nb12Zr3 amorphous film and electroplated Ni-Zn(-Co) ferrite films. The FMR loss generation at GHz frequency range is essential to realize this idea. The frequency range of loss generation can be adjusted to specific applications by materials selection and by the magnetic micro wiring technique. Insertion toss was only 0.7dB at 1GHz and reached 14 dB for a 17.2mm long coplanar transmission line with a 0.5-μm-thick Co85Nb12Zr3 film provided the in-between gap was 7.5 μm.
KW - Ferromagnetic resonance
KW - Integrated in-line countermeasure
KW - Integrated shield
KW - Magnetic films
KW - Permeability
UR - http://www.scopus.com/inward/record.url?scp=85020249351&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85020249351&partnerID=8YFLogxK
U2 - 10.1109/ICSMC2.2003.1429063
DO - 10.1109/ICSMC2.2003.1429063
M3 - Conference contribution
AN - SCOPUS:85020249351
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 931
EP - 934
BT - IEEE International Symposium on Electromagnetic Compatibility
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2003 IEEE International Symposium on Electromagnetic Compatibility, EMC 2003
Y2 - 11 May 2003 through 16 May 2003
ER -