Applications of high-resolution MFM system with low-moment probe in a vacuum

T. Yamaoka; K. Watanabe; Y. Shirakawabe; K. Chinone; E. Saitoh; M. Tanaka; H. Miyajima

doi:10.1109/TMAG.2005.854926

Applications of high-resolution MFM system with low-moment probe in a vacuum

T. Yamaoka, K. Watanabe, Y. Shirakawabe, K. Chinone, E. Saitoh, M. Tanaka, H. Miyajima

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Magnetic force microscopy (MFM) is very useful for observing magnetic domain structures. However, due to stray fields from an MFM probe, observations of small magnetic domain structures are limited. The authors have developed a high-resolution MFM system that utilizes a low-moment probe and a quality (Q)-controlled prove driver, which allows high-quality measurement in a vacuum without disturbing domain structures. Using this system, a resolution finer than 20 nm was achieved. In this paper, the advantages of this MFM are demonstrated using a Permalloy honeycomb nanonetwork and a Permalloy semicircular loop.

Original language	English
Pages (from-to)	3733-3735
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	41
Issue number	10
DOIs	https://doi.org/10.1109/TMAG.2005.854926
Publication status	Published - 2005 Oct
Externally published	Yes

Keywords

Magnetic domains
Magnetic force microscopy
Q factor

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/TMAG.2005.854926

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abstract = "Magnetic force microscopy (MFM) is very useful for observing magnetic domain structures. However, due to stray fields from an MFM probe, observations of small magnetic domain structures are limited. The authors have developed a high-resolution MFM system that utilizes a low-moment probe and a quality (Q)-controlled prove driver, which allows high-quality measurement in a vacuum without disturbing domain structures. Using this system, a resolution finer than 20 nm was achieved. In this paper, the advantages of this MFM are demonstrated using a Permalloy honeycomb nanonetwork and a Permalloy semicircular loop.",

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T1 - Applications of high-resolution MFM system with low-moment probe in a vacuum

AU - Yamaoka, T.

AU - Watanabe, K.

AU - Shirakawabe, Y.

AU - Chinone, K.

AU - Saitoh, E.

AU - Tanaka, M.

AU - Miyajima, H.

PY - 2005/10

Y1 - 2005/10

N2 - Magnetic force microscopy (MFM) is very useful for observing magnetic domain structures. However, due to stray fields from an MFM probe, observations of small magnetic domain structures are limited. The authors have developed a high-resolution MFM system that utilizes a low-moment probe and a quality (Q)-controlled prove driver, which allows high-quality measurement in a vacuum without disturbing domain structures. Using this system, a resolution finer than 20 nm was achieved. In this paper, the advantages of this MFM are demonstrated using a Permalloy honeycomb nanonetwork and a Permalloy semicircular loop.

AB - Magnetic force microscopy (MFM) is very useful for observing magnetic domain structures. However, due to stray fields from an MFM probe, observations of small magnetic domain structures are limited. The authors have developed a high-resolution MFM system that utilizes a low-moment probe and a quality (Q)-controlled prove driver, which allows high-quality measurement in a vacuum without disturbing domain structures. Using this system, a resolution finer than 20 nm was achieved. In this paper, the advantages of this MFM are demonstrated using a Permalloy honeycomb nanonetwork and a Permalloy semicircular loop.

KW - Magnetic domains

KW - Magnetic force microscopy

KW - Q factor

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Applications of high-resolution MFM system with low-moment probe in a vacuum

Abstract

Keywords

ASJC Scopus subject areas

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