Applications of high-resolution MFM system with low-moment probe in a vacuum

T. Yamaoka, K. Watanabe, Y. Shirakawabe, K. Chinone, E. Saitoh, M. Tanaka, H. Miyajima

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

Magnetic force microscopy (MFM) is very useful for observing magnetic domain structures. However, due to stray fields from an MFM probe, observations of small magnetic domain structures are limited. The authors have developed a high-resolution MFM system that utilizes a low-moment probe and a quality (Q)-controlled prove driver, which allows high-quality measurement in a vacuum without disturbing domain structures. Using this system, a resolution finer than 20 nm was achieved. In this paper, the advantages of this MFM are demonstrated using a Permalloy honeycomb nanonetwork and a Permalloy semicircular loop.

Original languageEnglish
Pages (from-to)3733-3735
Number of pages3
JournalIEEE Transactions on Magnetics
Volume41
Issue number10
DOIs
Publication statusPublished - 2005 Oct
Externally publishedYes

Keywords

  • Magnetic domains
  • Magnetic force microscopy
  • Q factor

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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