Application of X-ray fluorescence holography to the analysis of the interior and surface of an yttrium oxide thin film

Jens R. Stellhorn, Shinya Hosokawa, Naohisa Happo, Hiroo Tajiri, Tomohiro Matsushita, Kenichi Kaminaga, Tomoteru Fukumura, Tetsuya Hasegawa, Koji Kimura, Kouichi Hayashi

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