Abstract
We report on the characterization of a thin film of yttrium oxide by X-ray fluorescence holography. The sample has a layered structure with an YO base layer and an oxidized Y2O3 surface. Both layers are clearly observed in the atomic image reconstructions, and their local structure is analyzed. We show that by using incident energies close to the absorption edge of the fluorescing atom, it becomes possible to observe the thin surface layer clearly, even next to a base layer containing the same fluorescing element.
Original language | English |
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Pages (from-to) | 70-73 |
Number of pages | 4 |
Journal | Surface and Interface Analysis |
Volume | 51 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2019 Jan |
Keywords
- X-ray fluorescence holography
- thin-film analysis
- yttrium oxide
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry