Application of X-ray fluorescence holography to the analysis of the interior and surface of an yttrium oxide thin film

Jens R. Stellhorn; Shinya Hosokawa; Naohisa Happo; Hiroo Tajiri; Tomohiro Matsushita; Kenichi Kaminaga; Tomoteru Fukumura; Tetsuya Hasegawa; Koji Kimura; Kouichi Hayashi

doi:10.1002/sia.6550

Application of X-ray fluorescence holography to the analysis of the interior and surface of an yttrium oxide thin film

Jens R. Stellhorn, Shinya Hosokawa, Naohisa Happo, Hiroo Tajiri, Tomohiro Matsushita, Kenichi Kaminaga, Tomoteru Fukumura, Tetsuya Hasegawa, Koji Kimura, Kouichi Hayashi

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

We report on the characterization of a thin film of yttrium oxide by X-ray fluorescence holography. The sample has a layered structure with an YO base layer and an oxidized Y₂O₃ surface. Both layers are clearly observed in the atomic image reconstructions, and their local structure is analyzed. We show that by using incident energies close to the absorption edge of the fluorescing atom, it becomes possible to observe the thin surface layer clearly, even next to a base layer containing the same fluorescing element.

Original language	English
Pages (from-to)	70-73
Number of pages	4
Journal	Surface and Interface Analysis
Volume	51
Issue number	1
DOIs	https://doi.org/10.1002/sia.6550
Publication status	Published - 2019 Jan

Keywords

X-ray fluorescence holography
thin-film analysis
yttrium oxide

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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Application of X-ray fluorescence holography to the analysis of the interior and surface of an yttrium oxide thin film. / Stellhorn, Jens R.; Hosokawa, Shinya; Happo, Naohisa; Tajiri, Hiroo; Matsushita, Tomohiro; Kaminaga, Kenichi ; Fukumura, Tomoteru; Hasegawa, Tetsuya; Kimura, Koji; Hayashi, Kouichi.

In: Surface and Interface Analysis, Vol. 51, No. 1, 01.2019, p. 70-73.

Research output: Contribution to journal › Article › peer-review

Stellhorn, Jens R. ; Hosokawa, Shinya ; Happo, Naohisa ; Tajiri, Hiroo ; Matsushita, Tomohiro ; Kaminaga, Kenichi ; Fukumura, Tomoteru ; Hasegawa, Tetsuya ; Kimura, Koji ; Hayashi, Kouichi. / Application of X-ray fluorescence holography to the analysis of the interior and surface of an yttrium oxide thin film. In: Surface and Interface Analysis. 2019 ; Vol. 51, No. 1. pp. 70-73.

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abstract = "We report on the characterization of a thin film of yttrium oxide by X-ray fluorescence holography. The sample has a layered structure with an YO base layer and an oxidized Y2O3 surface. Both layers are clearly observed in the atomic image reconstructions, and their local structure is analyzed. We show that by using incident energies close to the absorption edge of the fluorescing atom, it becomes possible to observe the thin surface layer clearly, even next to a base layer containing the same fluorescing element.",

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AU - Happo, Naohisa

AU - Tajiri, Hiroo

AU - Matsushita, Tomohiro

AU - Kaminaga, Kenichi

AU - Fukumura, Tomoteru

AU - Hasegawa, Tetsuya

AU - Kimura, Koji

AU - Hayashi, Kouichi

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AB - We report on the characterization of a thin film of yttrium oxide by X-ray fluorescence holography. The sample has a layered structure with an YO base layer and an oxidized Y2O3 surface. Both layers are clearly observed in the atomic image reconstructions, and their local structure is analyzed. We show that by using incident energies close to the absorption edge of the fluorescing atom, it becomes possible to observe the thin surface layer clearly, even next to a base layer containing the same fluorescing element.

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