TY - JOUR
T1 - Application of x-ray excited optical luminescence to x-ray standing wave method and atomic resolution holography
AU - Hayashi, Koichi
AU - Hayashi, Tetsutaro
AU - Shishido, Toetsu
AU - Matsubara, Eiichiro
AU - Makino, Hisao
AU - Yao, Takafumi
AU - Matsushita, Tomohiro
PY - 2007/7/26
Y1 - 2007/7/26
N2 - X-ray excited optical luminescence (XEOL) was applied to the x-ray standing wave (XSW) method and atom-resolved x-ray holography (XH). We measured the incident beam angular dependence of the luminescence intensity from a ZnO-coated Al2 O3, and found that it corresponded to the XSW/XH pattern of Al2 O3. The present result demonstrates that hard x-ray XSW/XH studies for light elements, which have been difficult by fluorescence detection, can easily be carried out by XEOL detection.
AB - X-ray excited optical luminescence (XEOL) was applied to the x-ray standing wave (XSW) method and atom-resolved x-ray holography (XH). We measured the incident beam angular dependence of the luminescence intensity from a ZnO-coated Al2 O3, and found that it corresponded to the XSW/XH pattern of Al2 O3. The present result demonstrates that hard x-ray XSW/XH studies for light elements, which have been difficult by fluorescence detection, can easily be carried out by XEOL detection.
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U2 - 10.1103/PhysRevB.76.014119
DO - 10.1103/PhysRevB.76.014119
M3 - Article
AN - SCOPUS:34547429596
VL - 76
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
SN - 0163-1829
IS - 1
M1 - 014119
ER -