Application of x-ray excited optical luminescence to x-ray standing wave method and atomic resolution holography

Koichi Hayashi, Tetsutaro Hayashi, Toetsu Shishido, Eiichiro Matsubara, Hisao Makino, Takafumi Yao, Tomohiro Matsushita

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

X-ray excited optical luminescence (XEOL) was applied to the x-ray standing wave (XSW) method and atom-resolved x-ray holography (XH). We measured the incident beam angular dependence of the luminescence intensity from a ZnO-coated Al2 O3, and found that it corresponded to the XSW/XH pattern of Al2 O3. The present result demonstrates that hard x-ray XSW/XH studies for light elements, which have been difficult by fluorescence detection, can easily be carried out by XEOL detection.

Original languageEnglish
Article number014119
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume76
Issue number1
DOIs
Publication statusPublished - 2007 Jul 26

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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