X-ray excited optical luminescence (XEOL) was applied to the x-ray standing wave (XSW) method and atom-resolved x-ray holography (XH). We measured the incident beam angular dependence of the luminescence intensity from a ZnO-coated Al2 O3, and found that it corresponded to the XSW/XH pattern of Al2 O3. The present result demonstrates that hard x-ray XSW/XH studies for light elements, which have been difficult by fluorescence detection, can easily be carried out by XEOL detection.
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 2007 Jul 26|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics