Application of positron beams to the study of positronium-forming solids

Y. Kobayashi, K. Ito, T. Oka, C. He, H. F.M. Mohamed, R. Suzuki, T. Ohdaira

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)


Doppler broadening of annihilation radiation (DBAR) and positron annihilation lifetime spectroscopy (PALS) have been successfully applied to the study of positronium (Ps)-forming amorphous solids such as polymers and silicon oxide in the bulk. Implementing depth selectivity to DBAR and PALS by combining them with variable-energy positron beams considerably broadens their applicability. Variation of incident positron energy over a wide range enables depth-profiling, whereas tuning of the beam energy enables the studies of surfaces, interfaces and thin films. In this paper, we discuss fundamentals and applications of energy variable DBAR and PALS for Ps-forming polymers and silicon oxide.

Original languageEnglish
Pages (from-to)174-178
Number of pages5
JournalApplied Surface Science
Issue number1
Publication statusPublished - 2008 Oct 31
Externally publishedYes


  • Annihilation radiation
  • Defect
  • Free volume
  • Lifetime
  • Polymer
  • Positron beam
  • Positronium
  • Silicon oxide

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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