Abstract
Doppler broadening of annihilation radiation (DBAR) and positron annihilation lifetime spectroscopy (PALS) have been successfully applied to the study of positronium (Ps)-forming amorphous solids such as polymers and silicon oxide in the bulk. Implementing depth selectivity to DBAR and PALS by combining them with variable-energy positron beams considerably broadens their applicability. Variation of incident positron energy over a wide range enables depth-profiling, whereas tuning of the beam energy enables the studies of surfaces, interfaces and thin films. In this paper, we discuss fundamentals and applications of energy variable DBAR and PALS for Ps-forming polymers and silicon oxide.
| Original language | English |
|---|---|
| Pages (from-to) | 174-178 |
| Number of pages | 5 |
| Journal | Applied Surface Science |
| Volume | 255 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2008 Oct 31 |
| Externally published | Yes |
Keywords
- Annihilation radiation
- Defect
- Free volume
- Lifetime
- Polymer
- Positron beam
- Positronium
- Silicon oxide
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films
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Cite this
Kobayashi, Y., Ito, K., Oka, T., He, C., Mohamed, H. F. M., Suzuki, R., & Ohdaira, T. (2008). Application of positron beams to the study of positronium-forming solids. Applied Surface Science, 255(1), 174-178. https://doi.org/10.1016/j.apsusc.2008.05.278