Application of positron beams to the study of positronium-forming solids

Y. Kobayashi; K. Ito; T. Oka; C. He; H. F.M. Mohamed; R. Suzuki; T. Ohdaira

doi:10.1016/j.apsusc.2008.05.278

Application of positron beams to the study of positronium-forming solids

Y. Kobayashi, K. Ito, T. Oka, C. He, H. F.M. Mohamed, R. Suzuki, T. Ohdaira

Research output: Contribution to journal › Article › peer-review

18 Citations (Scopus)

Abstract

Doppler broadening of annihilation radiation (DBAR) and positron annihilation lifetime spectroscopy (PALS) have been successfully applied to the study of positronium (Ps)-forming amorphous solids such as polymers and silicon oxide in the bulk. Implementing depth selectivity to DBAR and PALS by combining them with variable-energy positron beams considerably broadens their applicability. Variation of incident positron energy over a wide range enables depth-profiling, whereas tuning of the beam energy enables the studies of surfaces, interfaces and thin films. In this paper, we discuss fundamentals and applications of energy variable DBAR and PALS for Ps-forming polymers and silicon oxide.

Original language	English
Pages (from-to)	174-178
Number of pages	5
Journal	Applied Surface Science
Volume	255
Issue number	1
DOIs	https://doi.org/10.1016/j.apsusc.2008.05.278
Publication status	Published - 2008 Oct 31
Externally published	Yes

Keywords

Annihilation radiation
Defect
Free volume
Lifetime
Polymer
Positron beam
Positronium
Silicon oxide

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/j.apsusc.2008.05.278

Cite this

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abstract = "Doppler broadening of annihilation radiation (DBAR) and positron annihilation lifetime spectroscopy (PALS) have been successfully applied to the study of positronium (Ps)-forming amorphous solids such as polymers and silicon oxide in the bulk. Implementing depth selectivity to DBAR and PALS by combining them with variable-energy positron beams considerably broadens their applicability. Variation of incident positron energy over a wide range enables depth-profiling, whereas tuning of the beam energy enables the studies of surfaces, interfaces and thin films. In this paper, we discuss fundamentals and applications of energy variable DBAR and PALS for Ps-forming polymers and silicon oxide.",

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T1 - Application of positron beams to the study of positronium-forming solids

AU - Kobayashi, Y.

AU - Ito, K.

AU - Oka, T.

AU - He, C.

AU - Mohamed, H. F.M.

AU - Suzuki, R.

AU - Ohdaira, T.

PY - 2008/10/31

Y1 - 2008/10/31

N2 - Doppler broadening of annihilation radiation (DBAR) and positron annihilation lifetime spectroscopy (PALS) have been successfully applied to the study of positronium (Ps)-forming amorphous solids such as polymers and silicon oxide in the bulk. Implementing depth selectivity to DBAR and PALS by combining them with variable-energy positron beams considerably broadens their applicability. Variation of incident positron energy over a wide range enables depth-profiling, whereas tuning of the beam energy enables the studies of surfaces, interfaces and thin films. In this paper, we discuss fundamentals and applications of energy variable DBAR and PALS for Ps-forming polymers and silicon oxide.

AB - Doppler broadening of annihilation radiation (DBAR) and positron annihilation lifetime spectroscopy (PALS) have been successfully applied to the study of positronium (Ps)-forming amorphous solids such as polymers and silicon oxide in the bulk. Implementing depth selectivity to DBAR and PALS by combining them with variable-energy positron beams considerably broadens their applicability. Variation of incident positron energy over a wide range enables depth-profiling, whereas tuning of the beam energy enables the studies of surfaces, interfaces and thin films. In this paper, we discuss fundamentals and applications of energy variable DBAR and PALS for Ps-forming polymers and silicon oxide.

KW - Annihilation radiation

KW - Defect

KW - Free volume

KW - Lifetime

KW - Polymer

KW - Positron beam

KW - Positronium

KW - Silicon oxide

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Application of positron beams to the study of positronium-forming solids

Abstract

Keywords

ASJC Scopus subject areas

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