TY - JOUR
T1 - Application of energy dispersive grazing incidence X-ray reflectometry method to structural analysis of liquid/liquid and liquid/solid interfaces
AU - Sato, Shigeo
AU - Imanaga, Takuo
AU - Matsubara, Eiichiro
AU - Saito, Masatoshi
AU - Waseda, Yoshio
N1 - Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2000/12
Y1 - 2000/12
N2 - The usefulness and validity of energy dispersive grazing incidence X-ray reflectometry (ED-GIXR) have been demonstrated for characterizing the liquid/liquid and liquid/solid interfaces. The present method appears to hold promise in reducing difficulty of conventional angular dispersive method due to absorption with an upper half liquid layer by enabling the use of high energy white X-ray radiation and obtaining much higher reflected intensity. An apparatus newly built for the exclusive use of the ED-GIXR is described with some selected examples of X-ray reflectivity profiles of solution/mercury and solution/electrode interfaces.
AB - The usefulness and validity of energy dispersive grazing incidence X-ray reflectometry (ED-GIXR) have been demonstrated for characterizing the liquid/liquid and liquid/solid interfaces. The present method appears to hold promise in reducing difficulty of conventional angular dispersive method due to absorption with an upper half liquid layer by enabling the use of high energy white X-ray radiation and obtaining much higher reflected intensity. An apparatus newly built for the exclusive use of the ED-GIXR is described with some selected examples of X-ray reflectivity profiles of solution/mercury and solution/electrode interfaces.
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U2 - 10.2320/matertrans1989.41.1651
DO - 10.2320/matertrans1989.41.1651
M3 - Article
AN - SCOPUS:0034473833
VL - 41
SP - 1651
EP - 1656
JO - [No source information available]
JF - [No source information available]
IS - 12
ER -