Application of energy dispersive grazing incidence X-ray reflectometry method to structural analysis of liquid/liquid and liquid/solid interfaces

Shigeo Sato, Takuo Imanaga, Eiichiro Matsubara, Masatoshi Saito, Yoshio Waseda

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The usefulness and validity of energy dispersive grazing incidence X-ray reflectometry (ED-GIXR) have been demonstrated for characterizing the liquid/liquid and liquid/solid interfaces. The present method appears to hold promise in reducing difficulty of conventional angular dispersive method due to absorption with an upper half liquid layer by enabling the use of high energy white X-ray radiation and obtaining much higher reflected intensity. An apparatus newly built for the exclusive use of the ED-GIXR is described with some selected examples of X-ray reflectivity profiles of solution/mercury and solution/electrode interfaces.

Original languageEnglish
Pages (from-to)1651-1656
Number of pages6
JournalUnknown Journal
Volume41
Issue number12
DOIs
Publication statusPublished - 2000 Dec

ASJC Scopus subject areas

  • Engineering(all)

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