Application of coincidence of reciprocal lattice point model to metal/sapphire hetero interfaces

Christine Marie Montesa, Naoya Shibata, Tetsuya Tohei, Kazuhiro Akiyama, Yoshirou Kuromitsu, Yuichi Ikuhara

    Research output: Contribution to journalArticle

    5 Citations (Scopus)

    Abstract

    Coincidence of reciprocal lattice point (CRLP) model was used to predict the stable orientation relationships of metal/α-Al2O 3 hetero interfaces from geometrical considerations. The predicted stable orientation relationships (ORs) between various metals and α-Al2O3 agreed well with the experimentally observed ORs at the hetero interfaces fabricated by film growth processes. In the bcc metal/α-Al2O3 systems with different fabrication processes such as internal oxidation, Burgers and Pitsch-Schrader ORs were experimentally observed, which have not been predicted as the most stable orientation relationships by CRLP. However, these ORs are predicted in CRLP as secondary stable orientations.

    Original languageEnglish
    Pages (from-to)234-238
    Number of pages5
    JournalMaterials Science and Engineering B: Solid-State Materials for Advanced Technology
    Volume173
    Issue number1-3
    DOIs
    Publication statusPublished - 2010 Jan 7

    Keywords

    • CRLP
    • Crystallographic orientation relationship
    • Epitaxy
    • Geometrical coherency
    • Metal/ceramic interface
    • Metal/sapphire interface

    ASJC Scopus subject areas

    • Materials Science(all)
    • Condensed Matter Physics
    • Mechanical Engineering
    • Mechanics of Materials

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