Application of an X-ray flat panel sensor to a GeV region gamma-ray beam profile monitor

Hiroki Kanda, Kazuhisa Honda, Takatsugu Ishikawa, Masashi Kaneta, Kazushige Maeda, Manabu Miyabe, Yuta Muroi, Wataru Nakai, Satoshi N. Nakamura, Aki Ninomiya, Yuki Obara Kyoichiio Ozawa, Keiichi Ozek, Takayuki Sasaki, Hajime Shimizu, Atsushi O. Tokryasu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A beam profile monitor for 1-GeV region gamma-ray beams has been developed using an X-ray flat panel sensor. In order to increase its sensitivity to gamma-rays, a converter plate was placed on the input window. We tested its sensitivity to input gamma-ray photons with various types of converter plates. The output brightness of the pixels was found to be correlated to the number of electrons and positrons converted from the gamma-ray photons. A measured profile of the 1-GeV region gamma-ray beams obtained with a 1-mm thick lead plate was consistent with the beam profile measured with plastic scintillator hodoscopes. It suggested that the X-ray flat panel sensor was sufficiently applicable to the beam profile monitor for 1-GeV region gamma-ray beams.

Original languageEnglish
Title of host publication2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509016426
DOIs
Publication statusPublished - 2017 Oct 16
Event2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France
Duration: 2016 Oct 292016 Nov 6

Publication series

Name2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Volume2017-January

Other

Other2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Country/TerritoryFrance
CityStrasbourg
Period16/10/2916/11/6

ASJC Scopus subject areas

  • Radiology Nuclear Medicine and imaging
  • Instrumentation
  • Nuclear and High Energy Physics
  • Electronic, Optical and Magnetic Materials

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