Antiferromagnet thickness dependence of the training effect in exchange-coupled CoFe/MnIr bilayers

Dong Young Kim, Seok Soo Yoon, Cheolgi Kim, M. Tsunoda, M. Takahashi

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

The antiferromagnet thickness dependence of the net training effect is studied in exchange-coupled CoFe/MnIr bilayers. The maximum net training effect is observed near the critical thickness of the antiferromagnetic layer. The easy-axis redistribution of the unpinned antiferromagneic grains is explained by the two cycles of ferromagnetic-resonance measurement. The linear relationship between the net training effect and rotational hysteresis loss directly confirms that the training effect in ferromagnetic/antiferromagnetic bilayers originates from the reorientation of the unpinned antiferromagnetic grains from initial alignment to the final random state during consecutive cycles of hysteresis loops measurement.

Original languageEnglish
Article number5257288
Pages (from-to)3865-3868
Number of pages4
JournalIEEE Transactions on Magnetics
Volume45
Issue number10
DOIs
Publication statusPublished - 2009 Oct
Externally publishedYes

Keywords

  • Exchange coupling
  • Rotational loss
  • Training effect
  • Unpinned antiferromagnetic grains

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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