ANOMALOUS PERMEATION OF LOW ENERGY NEON ATOMS IN TUNGSTEN AT LOW TEMPERATURES.

Susumu Fukatsu, Tomihiro Hashizume, Akira Sakai, Toshio Sakurai, Shin ichi Hyodo

    Research output: Chapter in Book/Report/Conference proceedingChapter

    4 Citations (Scopus)

    Abstract

    Atomic depth profiles of tungsten tips irradiated with neon atoms of low thermal energy left bracket i) 77 K ii) 300 K right bracket were measured with the aid of an atom-probe field ion microscope. The tip temperature was maintained usually at 25 plus or minus 1 K during the course of atom-probe measurements to practically eliminate thermal diffusion. In the case of i), neon atoms were detected at locations as deep as 300 layers from the surface, a depth much greater than that predicted assuming the usual diffusion mechanism. In the case of ii), however, no neon atoms were detected in the matrix. At present no theory seems to have been established to explain such anomalous penetration of low energy neon atoms.

    Original languageEnglish
    Title of host publicationJapanese Journal of Applied Physics, Part 2: Letters
    Pages240-243
    Number of pages4
    Volume25
    Edition3
    Publication statusPublished - 1986 Mar

    ASJC Scopus subject areas

    • Engineering(all)

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