Anomalous low-angle X-ray diffraction in sputter-deposited Fe/Cr multilayers and its relation to the giant magnetoresistance

S. Joo, Y. Obi, K. Takanashi, H. Fujimori

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Low-angle X-ray diffraction analysis was carried out on the [Fe(30 Å)/Cr (10 Å)]22 thin films prepared by two-gun magnetron sputtering under various argon pressures. It turned out that the magnetoresistance (MR) of these films was very sensitive to the argon pressure during sputtering. According to X-ray analysis it seemed that at low argon pressures (< 20 mTorr) intermixing of each layer occured and at high pressures (> 40 mTorr) the layers became fluctuating, which caused a splitting of the low-angle X-ray peaks. A layer fluctuation model (LFM) is suggested to explain the existence of the optimum argon pressure (in terms of the MR) in this artificial superlattice.

Original languageEnglish
Pages (from-to)1753-1754
Number of pages2
JournalJournal of Magnetism and Magnetic Materials
Volume104-107
Issue numberPART 3
DOIs
Publication statusPublished - 1992 Feb 2

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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