Anomalous lattice shrink of a single CeO2submicrometer particle in an optical trap

Yoshimitsu Fukuyama; Nobuhiro Yasuda; Shigeru Kimura; Masaki Takata

doi:10.7566/JPSJ.82.114608

Anomalous lattice shrink of a single CeO₂submicrometer particle in an optical trap

Yoshimitsu Fukuyama, Nobuhiro Yasuda, Shigeru Kimura, Masaki Takata

Center for Advanced Microscopy and Spectroscopy

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Anomalous lattice shrink is observed in a single submicrometer-sized CeO₂particle with X-ray diffraction using an optical-trap sample holder. A CeO₂particle 380 nm in size is successfully levitated with radiation pressure force exerted by counterpropagating laser beams and irradiated by a high-flux focused synchrotron radiation beam. The diffraction pattern of a single particle is consistent with that of CeO₂but the lattice shrink approaches 1.22% of the lattice constant of a particle assemblage.

Original language	English
Article number	114608
Journal	journal of the physical society of japan
Volume	82
Issue number	11
DOIs	https://doi.org/10.7566/JPSJ.82.114608
Publication status	Published - 2013 Nov

Keywords

Lattice shrink
Optical trap
Submicrometer particle
X-ray diffraction

ASJC Scopus subject areas

Physics and Astronomy(all)

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abstract = "Anomalous lattice shrink is observed in a single submicrometer-sized CeO2particle with X-ray diffraction using an optical-trap sample holder. A CeO2particle 380 nm in size is successfully levitated with radiation pressure force exerted by counterpropagating laser beams and irradiated by a high-flux focused synchrotron radiation beam. The diffraction pattern of a single particle is consistent with that of CeO2but the lattice shrink approaches 1.22% of the lattice constant of a particle assemblage.",

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AU - Kimura, Shigeru

AU - Takata, Masaki

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AB - Anomalous lattice shrink is observed in a single submicrometer-sized CeO2particle with X-ray diffraction using an optical-trap sample holder. A CeO2particle 380 nm in size is successfully levitated with radiation pressure force exerted by counterpropagating laser beams and irradiated by a high-flux focused synchrotron radiation beam. The diffraction pattern of a single particle is consistent with that of CeO2but the lattice shrink approaches 1.22% of the lattice constant of a particle assemblage.

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KW - Submicrometer particle

KW - X-ray diffraction

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