Anomalous electronic states in graphite studied by angle-resolved photoemission spectroscopy

K. Sugawara, T. Sato, S. Souma, T. Takahashi, H. Suematsu

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

We report high-resolution angle-resolved photoemission spectroscopy (ARPES) on high quality single crystal of graphite (kish graphite) to elucidate the origin of anomalous physical properties of carbon-based materials. We found an almost flat band in the vicinity of the Fermi level around the K(H) point which is not predicted by the bulk band calculation. We discuss the origin of this anomalous structure in relation to the edge-localized state on the step edges of cleaved surface.

Original languageEnglish
Pages (from-to)S94-S98
JournalScience and Technology of Advanced Materials
Volume7
Issue numberSUPPL. 1
Publication statusPublished - 2006

Keywords

  • Angle-resolved photoemission spectroscopy
  • Edge-localized state
  • Graphite

ASJC Scopus subject areas

  • Materials Science(all)

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