The transport and giant magnetoresistance (GMR) behavior on annealing was investigated in conjunction with the change in microstructure. Electrical resistivity and magnetoresistance were measured in a four-terminal geometry with in-plane current. Microstructures were determined using small angle X-ray scattering (SAXS) measurements and transmission electron microscopy (TEM).
|Journal||Digests of the Intermag Conference|
|Publication status||Published - 1999 Dec 1|
|Event||Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea|
Duration: 1999 May 18 → 1999 May 21
ASJC Scopus subject areas
- Electrical and Electronic Engineering