TY - GEN
T1 - Annealing behavior of a-IGZO film deposited by rotation magnet sputtering
AU - Hiroe, Akihiko
AU - Goto, Tetsuya
AU - Ohmi, Tadahiro
PY - 2011/12/1
Y1 - 2011/12/1
N2 - We have developed Rotation Magnet Sputtering where small erosion loops move thereby creating uniform erosion over the target. Target utilization rate can be more than 60%. Investigation on the annealing behavior deposited by Rotation Magnet Sputtering revealed that oxygen out diffusion during the post annealing depends on deposition chemistry.
AB - We have developed Rotation Magnet Sputtering where small erosion loops move thereby creating uniform erosion over the target. Target utilization rate can be more than 60%. Investigation on the annealing behavior deposited by Rotation Magnet Sputtering revealed that oxygen out diffusion during the post annealing depends on deposition chemistry.
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M3 - Conference contribution
AN - SCOPUS:84870673973
SN - 9781622761906
T3 - Proceedings of the International Display Workshops
SP - 665
EP - 668
BT - Society for Information Display - 18th International Display Workshops 2011, IDW'11
T2 - 18th International Display Workshops 2011, IDW 2011
Y2 - 7 December 2011 through 9 December 2011
ER -