A significant role of refraction effect on reflection high-energy electron diffraction (RHEED) from nanostructures is demonstrated. It was found that the chevron-shape spots in RHEED patterns from self-assembled InAs/GaAs(001) and InAs/InAlAs/InP(001) quantum dots at (formula presented) azimuth are well reproduced by kinematical calculations taking into account the refraction of electron beam at the curved surfaces of the dots. The dots must have (formula presented) cross sections steeper than (110) cross sections and consequently extend along (formula presented) since the refraction effects, considerable only at glancing incidence and departure, are invisible at  azimuth.
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 2001 Jan 1|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics