Anisotropic lattice expansion and magnetism in sputter-deposited Ca(La)B6 films

Y. Sakuraba; H. Kato; F. Sato; T. Miyazaki

doi:10.1103/PhysRevB.69.140406

Anisotropic lattice expansion and magnetism in sputter-deposited Ca(La)B₆ films

Y. Sakuraba, H. Kato, F. Sato, T. Miyazaki

ENG - Applied Physics

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

Nanocrystalline thin films of CaB₆ and Ca_0.995La _0.005B₆ were fabricated in this study using rf-magnetron sputtering. X-ray diffraction (XRD) measurements and scanning electron microscopy/energy dispersive spectrometer analyses revealed that lattice expansion of up to 6% with respect to the bulk value occurs along the direction perpendicular to the film plane. It is caused by the trapping of Ar gas into the film. On the other hand, in-plane XRD showed that spacing along the directions within the film plane is shrunk slightly. Large ferromagnetic moment of 0.01-0.02 μ_B/f.u. was observed in some La-doped films only when the lattice expansion rate was larger than 2.5%. The Curie temperature was found to be markedly higher than 400 K.

Original language	English
Article number	140406
Pages (from-to)	140406-1-140406-4
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	69
Issue number	14
DOIs	https://doi.org/10.1103/PhysRevB.69.140406
Publication status	Published - 2004 Apr

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.69.140406

Cite this

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title = "Anisotropic lattice expansion and magnetism in sputter-deposited Ca(La)B6 films",

abstract = "Nanocrystalline thin films of CaB6 and Ca0.995La 0.005B6 were fabricated in this study using rf-magnetron sputtering. X-ray diffraction (XRD) measurements and scanning electron microscopy/energy dispersive spectrometer analyses revealed that lattice expansion of up to 6% with respect to the bulk value occurs along the direction perpendicular to the film plane. It is caused by the trapping of Ar gas into the film. On the other hand, in-plane XRD showed that spacing along the directions within the film plane is shrunk slightly. Large ferromagnetic moment of 0.01-0.02 μB/f.u. was observed in some La-doped films only when the lattice expansion rate was larger than 2.5%. The Curie temperature was found to be markedly higher than 400 K.",

author = "Y. Sakuraba and H. Kato and F. Sato and T. Miyazaki",

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T1 - Anisotropic lattice expansion and magnetism in sputter-deposited Ca(La)B6 films

AU - Sakuraba, Y.

AU - Kato, H.

AU - Sato, F.

AU - Miyazaki, T.

PY - 2004/4

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AB - Nanocrystalline thin films of CaB6 and Ca0.995La 0.005B6 were fabricated in this study using rf-magnetron sputtering. X-ray diffraction (XRD) measurements and scanning electron microscopy/energy dispersive spectrometer analyses revealed that lattice expansion of up to 6% with respect to the bulk value occurs along the direction perpendicular to the film plane. It is caused by the trapping of Ar gas into the film. On the other hand, in-plane XRD showed that spacing along the directions within the film plane is shrunk slightly. Large ferromagnetic moment of 0.01-0.02 μB/f.u. was observed in some La-doped films only when the lattice expansion rate was larger than 2.5%. The Curie temperature was found to be markedly higher than 400 K.

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Anisotropic lattice expansion and magnetism in sputter-deposited Ca(La)B₆ films

Abstract

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