@article{318d15f04f704e75b412c9a137ff2aed,
title = " Anion-Substitution-Induced Nonrigid Variation of Band Structure in SrNbO 3-x Nx (0 ≤ x ≤ 1) Epitaxial Thin Films ",
abstract = " Pervoskite oxynitrides exhibit rich functionalities such as colossal magnetoresistance and high photocatalytic activity. The wide tunability of physical properties by the N/O ratio makes perovskite oxynitrides promising as optical and electrical materials. However, composition-dependent variation of the band structure, especially under partially substituted composition, is not yet well understood. In this study, we quantitatively analyzed the composition-dependent variation of band structure of a series of SrNbO 3-x N x (0 ≤ x ≤ 1.02) epitaxial thin films. Electrical conductivity decreased along with the increase of N content x as a result of an increase in Nb valence from 4+ to 5+. Optical measurements revealed that the N 2p band is formed at a critical composition between 0.07 < x < 0.38, which induces charge-transfer transition (CTT) in the visible-light region. These variations in the band structure were explained by first-principles calculations. However, the CTT energy slightly increased at higher N contents (i.e., lower carrier density) on contrary to the expectation based on the rigid-band-like shift of the Fermi level, which suggests a complex combination of the following band-shifting effects induced by N-substitution: whereas (1) reduction of the Burstein-Moss effect causes CTT energy reduction, (2) enhancement of hybridization between Nb 4d and N 2p orbitals and/or (3) suppression of many-body effects enlarge the band gap energy at larger N content. The band structure variation in perovskite oxynitride as presently elucidated would be a guidepost for future material design.",
keywords = "band engineering, epitaxial thin film, oxide, oxynitride, perovskite",
author = "Daichi Oka and Yasushi Hirose and Masanori Kaneko and Shoichiro Nakao and Tomoteru Fukumura and Koichi Yamashita and Tetsuya Hasegawa",
note = "Funding Information: We thank Prof. Kimikazu Sasa, Mr. Satoshi Ishii, Dr. Hiroshi Naramoto, and Dr. Daiichiro Sekiba of the University of Tsukuba for their assistance with the NRA measurements. XPS was measured at Research Hub for Advanced Nano Characterization, The University of Tokyo, supported by the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan (project no. 12024046). This study was supported by the Core Research for Evolutional Science and Technology (CREST) program of the Japan Science and Technology Agency (JST) (no. JPMJCR12C4) and Grants-in-Aid for Scientific Research (nos. 15H01043, 12J08258, 16K05737, and 16H06441) from the Japan Society for the Promotion of Science (JSPS). Theoretical calculations in this study were performed using facilities at the Supercomputer Center in Institute for Solid State Physics (ISSP) of University of Tokyo and at Research Center for Computational Science in Institute for Molecular Science (IMS) in Okazaki, Japan. Funding Information: We thank Prof. Kimikazu Sasa, Mr. Satoshi Ishii Dr. Hiroshi Naramoto, and Dr. Daiichiro Sekiba of the University of Tsukuba for their assistance with the NRA measurements. XPS was measured at Research Hub for Advanced Nano Characterization, The University of Tokyo, supported by the Ministry of Education, Culture, Sports Science and Technology (MEXT), Japan (project no. 12024046). This study was supported by the Core Research for Evolutional Science and Technology (CREST) program of the Japan Science and Technology Agency (JST) (no. JPMJCR12C4) and Grants-in-Aid for Scientific Research (nos. 15H01043, 12J08258, 16K05737, and 16H06441) from the Japan Society for the Promotion of Science (JSPS). Theoretical calculations in this study were performed using facilities at the Supercomputer Center in Institute for Solid State Physics (ISSP) of University of Tokyo and at Research Center for Computational Science in Institute for Molecular Science (IMS) in Okazaki, Japan. Publisher Copyright: {\textcopyright} 2018 American Chemical Society.",
year = "2018",
month = oct,
day = "17",
doi = "10.1021/acsami.8b08577",
language = "English",
volume = "10",
pages = "35008--35015",
journal = "ACS applied materials & interfaces",
issn = "1944-8244",
publisher = "American Chemical Society",
number = "41",
}