Angular dependence of exchange bias and coercivity in polycrystalline CoFe/MnIr bilayers

Dong Young Kim, Cheol Gi Kim, Chong Oh Kim, M. Tsunoda, Migaku Takahashi

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

We have investigated the angular dependence of exchange bias (Hex) and coercivity (Hc) in polycrystalline CoFe (100 nm)/MnIr(x) bilayers with x=0, 2, 4, 10 and 20 nm. The angular dependence of Hex and Hc show the abrupt kinks at critical angle (θc) in the samples of Hc>Hex. The profiles of angular dependent Hex is changed at critical antiferromagnetic layer thickness ( tAFc ) and shows inverse proportional behavior with field angle from 90°-θc to 90°+θc. These complex angular dependence of Hex and Hc with antiferromagnetic layer thickness can be well explained by using the Stoner-Wohlfarth (S-W) model.

Original languageEnglish
Pages (from-to)e56-e58
JournalJournal of Magnetism and Magnetic Materials
Volume304
Issue number1
DOIs
Publication statusPublished - 2006 Sep 1

Keywords

  • Coercivity
  • Exchange bias
  • S-W model
  • Unidirectional anisotropy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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