Angle-scanned photoelectron diffraction

J. Osterwalder, P. Aebi, R. Fasel, D. Naumovic, P. Schwaller, T. Kreutz, L. Schlapbach, T. Abukawa, S. Kono

Research output: Contribution to journalArticlepeer-review

64 Citations (Scopus)

Abstract

A brief survey is given on the current state-of-the-art of this surface structural technique based on photoelectron spectroscopy, with particular emphasis on the progress that has been made recently by routinely measuring full-hemispherical intensity distributions. We limit the discussion to the photoelectron forward focusing regime, which is attained at electron kinetic energies of a few hundred eV. Surface bond directions are directly revealed as pronounced maxima in the angular distributions from subsurface atoms, while characteristic interference features are observed for surface species. For both cases the dependence on the atomic type is weak enough so that these features provide a fingerprint of the local bonding geometry. For surface and near-surface species, this may then serve as a starting point for a structure refinement using single-scattering cluster calculations. Selected examples are given for illustrating these procedures.

Original languageEnglish
Pages (from-to)1002-1014
Number of pages13
JournalSurface Science
Volume331-333
Issue numberPART B
DOIs
Publication statusPublished - 1995 Jul 1

Keywords

  • Photoelectron diffraction
  • Surface structure

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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