Angle-resolved XPS studies on transition layers at SiO2/Si interfaces

T. Hattori, K. Azuma, Y. Nakata, H. Nohira, H. Okamoto, E. Ikenaga, K. Kobayashi, Y. Takata, S. Shin

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Using the high-brilliance synchrotron radiation at super photon ring 8 (SPring-8) we determined the electron escape depths in approximately 1-nm-thick low-temperature oxide layers, which were formed on Si(1 1 1) at 300 °C using three kinds of atomic oxygen, and that in approximately 1-nm-thick thermally grown oxide layer formed in 1 Torr dry oxygen at 900°C by measuring Si 2p photoelectron spectra at the photon energy of 1050 eV. The results indicated that the electron escape depths in the three kinds of low-temperature oxide layers were 13-21% smaller than that in the thermally grown oxide layer. Furthermore, the electron escape depth in the thermally grown oxide layer, whose thickness was close to that of the structural transition layer, was 19% smaller than that in bulk SiO2.

Original languageEnglish
Pages (from-to)457-460
Number of pages4
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume144-147
DOIs
Publication statusPublished - 2005 Jun
Externally publishedYes

Keywords

  • Atomic oxygen
  • Electron escape depth
  • Oxidation process
  • XPS

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

Fingerprint

Dive into the research topics of 'Angle-resolved XPS studies on transition layers at SiO2/Si interfaces'. Together they form a unique fingerprint.

Cite this