Angle-resolved XPS for determination of diffusion coefficients and mobilities of cations in thin passive films

Katsuhiko Asami, Eiji Akiyama, Koji Hashimoto

Research output: Contribution to journalConference articlepeer-review

4 Citations (Scopus)

Abstract

Angle-resolved x-ray photoelectron spectroscopy (ARXPS) in combination with the generalized Fick's first law was applied to determine diffusion coefficients and mobilities of cations in passive films formed by anodic polarization on amorphous Al-Cr-Mo and Al-Ti-Mg alloys. The depth profiles of cations in the surface films were fitted to a depth distribution model expected from Fick's first law. From the fitting parameters, the diffusion coefficients and mobilities of Al, Cr and Ti cations in anodic films formed on Al-Cr-Mo and Al-Ti-Mg alloys were determined. Diffusion coefficients of cation M in the anodic film, D(M), were as follows: D(Al) = 4.02×10-19 cm2 s-1 and D(Cr) = 6.51×10-19 cm2 s-1 for Al-36Cr-9Mo Alloy; and D(Al) = 3.18×10-19 and D(Ti) = 2.36×10-19 cm2 s-1 for Al-36Ti-7Mg Alloy. The mobility ratios were μCrAl = 1.62 and μTiAl = 0.74, although both Cr and Ti were enriched in the surface region of the anodic films.

Original languageEnglish
Pages (from-to)106-111
Number of pages6
JournalSurface and Interface Analysis
Volume30
Issue number1
DOIs
Publication statusPublished - 2000 Aug 1
Event8th European Conference on Applications of Surface and Interface Analisys, ECASIA 99 - Sevilla, Spain
Duration: 1999 Oct 41999 Oct 8

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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