Angle-resolved photoemission study of a single-domain Si(001)2 × 1-Na surface with synchrotron radiation

T. Abukawa, T. Kashiwakura, T. Okane, H. Takahashi, S. Suzuki, S. Kono, S. Sato, T. Kinoshita, A. Kakizaki, T. Ishii, C. Y. Park, K. A. Kang, K. Sakamoto, T. Sakamoto

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

The electronic structures of a single-domain Si(001)2 × 1-Na surface at a saturation coverage have been studied by angle-resolved photoelectron spectroscopy (ARPES) with linearly polarized synchrotron radiation (SR). To determine the dispersion of surface states in detail, the ARPES spectra have been measured along several symmetry axes of the 2 × 1 surface Brillouin zone. The result revealed a new assignment of surface-state dispersions. Symmetry properties of upper surface-state bands are determined using a linearly polarized character of SR. It has been found that the upper two surface states have the same symmetries as the dangling bond of the clean Si(001)2 × 1 dimer surface. The electronic structure of the Si(001)2 × 1-Na surface determined here is very similar to that of the Si(001)2 × 1-K surface [Surf. Sci. 261 (1992) 217] and is consistent with that expected for an alkali double-layer model.

Original languageEnglish
Pages (from-to)146-152
Number of pages7
JournalSurface Science
Volume303
Issue number1-2
DOIs
Publication statusPublished - 1994 Feb 10

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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