Angle-resolved photoemission study of a single-domain Si(001)2 × 1-K surface with synchrotron radiation: symmetry and dispersion of surface-states

T. Abukawa, T. Kashiwakura, T. Okane, Y. Sasaki, H. Takahashi, Y. Enta, S. Suzuki, S. Kono, S. Sato, T. Kinoshita, A. Kakizaki, T. Ishii, C. Y. Park, S. W. Yu, K. Sakamoto, T. Sakamoto

Research output: Contribution to journalArticlepeer-review

30 Citations (Scopus)

Abstract

The electronic structures of a single-domain Si(001)2 × 1-K surface at saturation coverage have been studied by synchrotron radiation (SR) angle resolved photoelectron spectroscopy (ARPES). The ARPES spectra have been measured along several symmetry axes of the 2 × 1 surface Brillouin zone and surface state dispersions are depicted. Symmetry properties of upper surface-state bands are determined using the linearly polarized character of SR. The symmetries and dispersions of the upper surface states determined here are consistent with those expected for a K double-layer model.

Original languageEnglish
Pages (from-to)217-223
Number of pages7
JournalSurface Science
Volume261
Issue number1-3
DOIs
Publication statusPublished - 1992 Jan 15

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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